> Graphic Design > CAD > Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.
Author Rajesh Garg Publisher Springer Publication Date 2009-11-16 Binding Hardcover ISBN 1441909303 Number Of Pages 212 Sales Rank 3560348
